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1 article(s) from Kühler, Paul

Femtosecond-resolved ablation dynamics of Si in the near field of a small dielectric particle

Paul Kühler,
Daniel Puerto,
Mario Mosbacher,
Paul Leiderer,
Francisco Javier Garcia de Abajo,
Jan Siegel and
Javier Solis

Beilstein J. Nanotechnol. 2013, 4, 501–509, doi:10.3762/bjnano.4.59

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Figure 1: Schematic view of the spatial intensity distribution at the surface of a crystalline Si substrate i...

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Figure 2: Scheme of the experimental set-up used for sample irradiation and fs-resolved microscopy. (IF) inte...

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Figure 3: Surface reflectivity images of a particle-free c-Si surface exposed to a 120 fs laser pulse for dif...

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Figure 4: Normalized reflectivity as a function of delay measured for a particle-free, c-Si surface, at the c...

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Figure 5: (a) Calculated near field distribution at the surface of a Si substrate for a SiO₂ dielectric parti...

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Figure 6: Surface reflectivity images at the particle location for different time delays, upon exposure to a ...

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Figure 7: Surface reflectivity images at the particle location for two different delays (indicated), upon exp...

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Published 04 Sep 2013

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